The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Nov. 04, 2020
Applicant:

Spectrum Effect Inc., Kirkland, WA (US);

Inventors:

Rodrigo Vaca, Kirkland, WA (US);

Rekha Menon, Kirkland, WA (US);

Eamonn Gormley, Kirkland, WA (US);

Assignee:

Spectrum Effect Inc., Kirkland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/345 (2015.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04B 17/345 (2015.01); H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract

A method and system that separate thermal and background interference noise measurements from interference measurements can determine periodicity of an event using active percentage values. The active percentage value of an interference event may be determined based on unsupervised machine learning on a per-Recording Output Period (ROP) basis. The active percentage of the interference event may be used with other characteristics to help classify the interference source causing the interference. After measuring RF energy at a base station in the network at predetermined intervals over a plurality of consecutive first of time periods, for each time period, a method arranges binned values of the measured energy into at least one cluster, determines whether each cluster of the at least one cluster represents noise or interference, and characterizes the interference, and the method indicates a source of the interference.


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