The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Dec. 07, 2018
Applicant:

Sharp Nec Display Solutions, Ltd., Tokyo, JP;

Inventor:

Masatoshi Abe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/34 (2006.01); G09G 5/10 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3406 (2013.01); G09G 5/10 (2013.01); G09G 2300/026 (2013.01); G09G 2320/062 (2013.01); G09G 2320/0626 (2013.01); G09G 2320/0693 (2013.01);
Abstract

A multi-display system includes: a master display device; a first slave display device; an optical measuring instrument to measure luminance and color displayed by a first image display unit of the master display device; and a deterioration factor calculating unit to calculate a deterioration factor on the basis of a first set of measurement parameters, which represent the luminance and the color measured by the optical measuring instrument, and of initial values of the first set of measurement parameters. The master display device performs adjustment on the basis of the first set of measurement parameters. The first slave display device performs adjustment on the basis of a second set of measurement parameters of a second image display unit of the first slave display device, wherein the second set of measurement parameters are calculated from the deterioration factor and from initial values of the second set of measurement parameters.


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