The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
May. 23, 2019
Hitachi, Ltd., Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An embodiment of the process state analysis device of the present invention is provided with an evaluation value calculation unit and a graph creation unit. The evaluation value calculation unit calculates, within an evaluation value calculation range indicating a target range for calculating evaluation values, an evaluation value for each cluster that is classified on the basis of multi-dimensional process data output from each measurement device. The graph creation unit determines a hue for a graph element for each cluster on the basis of the evaluation value for the cluster as calculated within the evaluation value calculation range, and on the basis of a color reference evaluation value corresponding to a reference hue for the graph element, and creates and outputs a graph representing, for each aggregation unit time interval in a specified display period, the number of nodes belonging to each cluster.