The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Feb. 04, 2021
Aktiebolaget Skf, Gothenburg, SE;
Kareem Gouda, Utrecht, NL;
Haiyang Jackson Li, Gothenburg, SE;
AKTIEBOLAGET SKF, Gothenburg, SE;
Abstract
A method for detecting a characteristic of a machine or component according to a time and characteristic value record includes the steps of converting a time and characteristic value record of data samples of the machine or component in a selected time window to a two-dimensional pixel bitmap in a specified pixel window, horizontal coordinates of pixel points characterizing a time sequence of data samples and vertical coordinates of pixel points characterizing quantified characteristic values of the samples, the quantified characteristic values being pixel values converted from characteristic values of individual samples using a maximum value in the window as a standard; marking the pixel bitmap according to an existing conclusion to form a sample set for training a machine learning intelligent algorithm model; and using a pixel bitmap sample in the sample set to train the algorithm model; and using the model to detect from newly collected data samples.