The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Jan. 14, 2021
Apple Inc., Cupertino, CA (US);
Stuart Harl Ferguson, Sunnyvale, CA (US);
James Graham McCarter, Erie, CO (US);
Richard Ignatius Punsal Lozada, Cupertino, CA (US);
APPLE INC., Cupertino, CA (US);
Abstract
Various implementations disclosed herein include devices, systems, and methods for using a deformation model of a first object that is within a degree of similarity to a second object instead of creating a deformation model for the second object. In some implementations, a method includes obtaining an input to instantiate a first object in a graphical environment. The first object is characterized by a first set of response parameter values. A second object is identified. The second object is characterized by a second set of response parameter values that are within a threshold range of the first set of response parameter values. A deformation model of the second object is obtained. The deformation model defines a change in a visual property of the second object based on a condition. A change in a visual property of the first object is displayed based on the deformation model of the second object.