The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Mar. 19, 2020
Applicant:

Children's Hospital Medical Center, Cincinnati, OH (US);

Inventors:

Nehal Parikh, Cincinnati, OH (US);

Lili He, Cincinnati, OH (US);

Assignee:

Children's Hospital Medical Center, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G16H 30/40 (2018.01); G06T 2207/10088 (2013.01); G06T 2207/30016 (2013.01);
Abstract

A system for objectively analyzing medical image data for the presence of diffuse white matter abnormalities (DWMA) is configured to identify and determine DWMA characteristics that are not visually apparent. As compared to subjective visual diagnosis, objectively determined DWMA characteristics may be automatically compared to each other, and may be compared to and associated with various scales, evaluations, or other assessment criteria used to measure aspects of infant development. As a result, the disclosed system may objectively determine an impact that objectively determined DWMA characteristics will have on one or more developmental scales, which can be expressed as a time deficit, score deficit, or other value indicative of development deficits. The system may be integrated with medical imaging devices to provide near-immediate objective analysis for developmental impact at the point of care and in parallel with conventional imaging tasks, or may provide objective analysis results via a software interface.


Find Patent Forward Citations

Parikh, Nehal. (2022). Objective analysis of medical image data for white matter abnormality (U.S. Patent No. 11393087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11393087

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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