The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

May. 28, 2019
Applicant:

Hanwha Techwin Co., Ltd., Seongnam-si, KR;

Inventors:

Seung Jin Han, Seongnam-si, KR;

Geon Hyoung Lee, Seongnam-si, KR;

Byung Joon Song, Seongnam-si, KR;

Han Seok Seo, Seongnam-si, KR;

Bo A Jung, Seongnam-si, KR;

Jin Wook Huh, Seongnam-si, KR;

Ki Rim Lee, Seongnam-si, KR;

Assignee:

HANWHA TECHWIN CO., LTD., Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/40 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/40 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Disclosed herein is a method and apparatus for processing a thermal image. The method includes: performing histogram stretching on thermal image data of the thermal image; and adjusting a histogram stretching scale for thermal image data of a next frame using histogram data of the thermal image data on which the histogram stretching is performed. As a result, it is possible to mitigate that an image becomes less recognizable as thermal image data is deteriorated or saturated.


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