The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jul. 27, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Toru Shirai, Tokyo, JP;

Ryota Satoh, Tokyo, JP;

Yasuhiro Kamada, Tokyo, JP;

Masahiro Takizawa, Tokyo, JP;

Yoshihisa Sotome, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G01R 33/56 (2006.01); G01R 33/565 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G01R 33/5608 (2013.01); G01R 33/56545 (2013.01); G06T 5/50 (2013.01); G06T 2207/10088 (2013.01);
Abstract

In an image acquired by a plurality of receiver coils with the use of MRI, separated images are obtained by separating spatially overlapping signals according to PI method, and noise in the separated images is eliminated with a high degree of precision. A complex image spatially overlapping is measured from nuclear magnetic resonance signals received by a plurality of receiver coils, and spatially overlapping signals are separated and a plurality of separated images are calculated, by using sensitivity information of the plurality of receiver coils. Then, noise is eliminated based on a correlation of noise mixed between the separated images.


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