The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

May. 24, 2019
Applicants:

Canon Information and Imaging Solutions, Inc., Melville, NY (US);

Canon U.s.a., Inc., Melville, NY (US);

Inventors:

Xiwu Cao, Arcadia, CA (US);

Samuel Schrader, Irvine, CA (US);

Assignee:

Canon U.S.A., Inc., Melville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06K 9/62 (2022.01); G06F 17/15 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06N 7/00 (2013.01); G06F 17/15 (2013.01); G06F 17/18 (2013.01); G06K 9/6276 (2013.01);
Abstract

Applying a local-adapted minority oversampling strategy technique to an imbalanced dataset including positive samples belonging to a minority class and negative samples belonging to a majority class, the minority class being less prevalent than the majority class, wherein each sample from the dataset includes a plurality of features. The local-adapted minority oversampling strategy includes determining a local imbalance for each positive sample from the minority class corresponding to a number of other positive samples and/or negative samples within a neighborhood of each positive sample. The local-adapted minority oversampling strategy also includes calculating a local-adapted oversampling ratio based on the local imbalance estimated for each positive sample and replicating each positive sample using the local-adapted oversampling ratio to generate a new dataset.


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