The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Jun. 12, 2020
Branch Metrics, Inc., Redwood City, CA (US);
Eric Glover, Palo Alto, CA (US);
Jonas Bauer, Atherton, CA (US);
Rishi Khaitan, San Francisco, CA (US);
Matthew Dale, Seattle, WA (US);
Dmitri Gaskin, San Carlos, CA (US);
Charles Gilliam, Seattle, WA (US);
Pavan Achanta, Union City, CA (US);
Zachary Joel Rivest, Seattle, WA (US);
Nicholas Chen, Lake Forest Park, WA (US);
Branch Metrics, Inc., Palo Alto, CA (US);
Abstract
A method includes generating vertical-specific (VS) records from data sources. Each VS record includes a vertical identifier and a set of VS data fields. The method further comprises generating, for each VS record, an entity partial (EP) record that includes EP data fields populated from the VS data fields. The EP data fields include an entity ID that indicates an entity for the EP record, a source data field that identifies a data source, and an EP searchable data field including data that is descriptive of the entity. The method further comprises generating a search record for each entity ID by combining data from EP records. The data from the EP records is combined based on the source data included in the EP records. Each search record includes a search record searchable data field that includes data from one or more of the EP searchable data fields.