The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Mar. 29, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Kimberly R. Lu, Sunnyvale, CA (US);

Joseph S. Brandt, Salt Lake City, UT (US);

Nicholas A. Noto, Sunnyvale, CA (US);

Tipper Truong, San Jose, CA (US);

Mariah Arevalo, Woodland, CA (US);

Philip Shilane, Newtown, PA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 3/0604 (2013.01); G06F 3/0652 (2013.01); G06F 3/0683 (2013.01);
Abstract

Systems and methods for marking similarity groups impacted by a garbage collection operation are disclosed. Similarity groups are used to identify segments associated with objects in a computing system. Using deletion records that identify objects to be deleted, the similarity groups impacted by the deletion records can be identified. The live segments associated with the impacted similarity groups are also identified. This allows segments that are associated with the deleted objects and that are not associated with any live objects to be removed.


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