The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jun. 01, 2020
Applicant:

Cerner Innovation, Inc., Kansas City, KS (US);

Inventors:

Amit Amar Kumar, Karnataka, IN;

Chaithrika Rao, Karnataka, IN;

Shiv Shankar, Karnataka, IN;

Uttam Ramamurthy, Karnataka, IN;

Pratik Nath, Karnataka, IN;

Assignee:

Cerner Innovation, Inc., North Kansas City, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06K 9/62 (2022.01); G06V 10/20 (2022.01); G06V 30/10 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3664 (2013.01); G06F 11/3684 (2013.01); G06K 9/6262 (2013.01); G06V 10/20 (2022.01); G06V 30/10 (2022.01);
Abstract

The technology disclosed relates to generating automated test plan scripts. A selection of a first test plan to automate is received. Test scripts and data from a repository are retrieved and the test scripts and the data correspond to the first test plan. Test steps of the first test plan are performed. A prediction of a reusable component for a particular test step or test validation is provided for each of the test steps. A selection of at least one prediction for at least one of the test steps is received. An automated test plan script corresponding to the selection of the at least one prediction is generated.


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