The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jun. 20, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Ali Sadiq Mohamed, San Jose, CA (US);

Manish Swaminathan, Sunnyvale, CA (US);

Shunlin Liang, San Jose, CA (US);

Prateek Sachdev, Sunnyvale, CA (US);

Vivek Desai, Sunnyvale, CA (US);

Adam R. Peck, Redwood City, CA (US);

Sunny Sanjiv Ketkar, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06N 20/00 (2019.01);
Abstract

The disclosed embodiments provide a system for testing machine learning workflows. During operation, the system obtains a configuration for a staging test of a machine learning model, wherein the configuration includes a model name for the machine learning model, a duration of the staging test, and a use case associated with the machine learning model. Next, the system selects a staging test host for the staging test. The system then deploys the staging test on the staging test host in a staging environment, wherein the deployed staging test executes the machine learning model based on live traffic received from a production environment. After the staging test has completed, the system outputs a set of metrics representing a system impact of the machine learning model on the staging test host.


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