The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Mar. 26, 2019
Toshiba Mitsubishi-electric Industrial Systems Corporation, Tokyo, JP;
Hiroyuki Imanari, Tokyo, JP;
Naoki Shimoda, Tokyo, JP;
Abstract
An abnormality determination support apparatus includes an analysis object data preparation unit, a primary determination unit, and a secondary determination unit. The analysis object data preparation unit acquires a time-series signal representing at least one of a state of the manufacturing facility and a product quality from a data collection apparatus of the manufacturing facility, and extracts analysis object data from the time-series signal. The primary determination unit derives a plurality of primary determination results from common analysis object data by applying a plurality of different types of analysis methods to the analysis object data extracted by the analysis object data preparation unit. The secondary determination unit includes a machine learning device.