The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Oct. 24, 2019
Applicant:
Surgivance Inc., New York, NY (US);
Inventor:
Daniel Summer Gareau, New York, NY (US);
Assignee:
SURGIVANCE INC., New York, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B 9/00 (2021.01); G02B 21/00 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); G02B 26/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0084 (2013.01); G02B 21/008 (2013.01); G02B 21/0024 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0064 (2013.01); G02B 21/0076 (2013.01); G02B 21/26 (2013.01); G02B 21/368 (2013.01); G02B 26/04 (2013.01);
Abstract
A confocal microscope is provided that includes one or more lasers focused by an optical system into a line on the surface of a sample mounted to a stage. The microscope further includes, at least one linear array detector that is optically conjugated to the focused line. The stage permits movement of the sample with respect to all other components of the microscope, which remain stationary.