The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Oct. 10, 2018
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventor:

David Burke, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/58 (2006.01); G01S 13/53 (2006.01); G01S 7/292 (2006.01); G01S 7/41 (2006.01);
U.S. Cl.
CPC ...
G01S 13/582 (2013.01); G01S 7/292 (2013.01); G01S 7/414 (2013.01); G01S 13/53 (2013.01);
Abstract

A phase Doppler radar system may comprise a pulse Doppler receiver/transmitter (R/T) subsystem coupled with a processing subsystem. The system may determine target velocity and target detection events by collecting pulses from the pulse Doppler R/T subsystem, determine an undifferentiated phase of each of the pulses, differentiate the pulses, and determine a differentiated phase of each of the pulses. The system may perform a linear fit of the differentiated phases of the pulses to produce a slope and an intercept. The system may determine a set of initial estimates of coefficients of a nonlinear fit equation. The system may perform iterations of a nonlinear least squares fit, beginning with the initial coefficient estimates, to produce a non-linear fit result. The system may determine a goodness-of-fit (GoF) statistic associated with the nonlinear fit result, and declare a detection event when the GoF is superior to a GoF statistic associated Gaussian noise.


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