The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jul. 23, 2019
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

James Rosenzweig, Los Angeles, CA (US);

Nathan Majernik, Los Angeles, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2020.01); G01R 31/08 (2020.01);
U.S. Cl.
CPC ...
G01R 31/1209 (2013.01); G01R 31/1272 (2013.01);
Abstract

An apparatus and method for in-situ determination of arc location within a radio-frequency (RF) waveguide. At least one pair of sound vibration transducers are coupled to positions within the waveguide from which data is collected. When a threshold level of voltage standing wave ratio (VSWR) is exceeded, then transducer data is processed to determine time-of-flight (TOF), to then compare data between transducers, to identify the faster longitudinal component with speed of sound in the material of the waveguide, from which longitudinal position information about the arc is generated.


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