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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11391678 B1

PDFFull Text
Date of Patent:
Jul. 19, 2022

Filed:

Jul. 27, 2018

Device and method for detecting defect of optical film

Applicant:

Shanjin Optoelectronics (Suzhou) Co., Ltd., Zhangjiagang, CN;

Inventors:

Ho Jin Kim, Daejeon, KR;

Myoung Gon Yang, Daejeon, KR;

Hang Suk Choi, Daejeon, KR;

Eung Jin Jang, Daejeon, KR;

Assignee:

SHANJIN OPTOELECTRONICS (SUZHOU) CO., LTD., Zhangjiagang, CN;

Attorney:

Schhmeiser, Olsen & Watts, LLP

Primary Examiner:

Mark R Gaworecki

Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/89 (2006.01); G01N 21/95 (2006.01); G01N 21/896 (2006.01);
U.S. Cl.
CPC ...
G01N 21/896 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/95 (2013.01); G01N 2021/9513 (2013.01); G01N 2201/0636 (2013.01);
Abstract

Provided is a device for detecting a defect of an optical film, comprising a light emitting unit, a reflection unit, a screen, and an image capturing unit, and a method for detecting a defect of an optical film, comprising emitting light to a reflection unit, projecting the light reflected by the reflection unit onto an optical film, capturing an image of a screen which displays a projection shape obtained by projecting the light onto the optical film, and analyzing the image.

Find Patent Forward Citations

Kim, Ho. (2022). Device and method for detecting defect of optical film (U.S. Patent No. 11391678). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11391678

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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