The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Apr. 10, 2019
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Lars Fischheiter, Ludwigsburg, DE;

Reiner Stein, Bad Kreuznach, DE;

Martin Goebel, Weinheim, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); G01N 33/487 (2006.01); G01N 21/77 (2006.01); G01N 21/84 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/78 (2013.01); G01N 21/77 (2013.01); G01N 21/8483 (2013.01); G01N 33/487 (2013.01); G01N 2021/7723 (2013.01); G01N 2021/7759 (2013.01); G01N 2021/7766 (2013.01); G01N 2035/00128 (2013.01);
Abstract

A test element analysis system for analytical examination of a sample. The system comprises a measurement device, which comprises a test element receptacle for receiving at least one test element at least partially, wherein the receptacle comprises at least one first and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element, wherein the second part is movable relative to the first part, wherein the receptacle is configured to position the second part such that a test element may be inserted into the receptacle and to subsequently position the second part in a closed position such that at least one abutment surface of the second part rests on the test element.


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Fischheiter, Lars. (2022). Test element analysis system for the analytical examination of a sample (U.S. Patent No. 11391676). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11391676

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