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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11391625 B1

PDFFull Text
Date of Patent:
Jul. 19, 2022

Filed:

Aug. 23, 2019

Element for oscillating or detecting an electromagnetic wave and element manufacturing method

Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yoshinori Tateishi, Naka-gun, JP;

Shinichiro Watanabe, Kawasaki, JP;

Assignee:

CANON KABUSHIKI KAISHA, Tokyo, JP;

Attorney:

Venable LLP

Primary Examiner:

David P Porta

Assistant Examiner:

Meenakshi S Sahu

Int. Cl.
CPC ...
G01J 1/42 (2006.01); H01Q 7/00 (2006.01); H01Q 1/36 (2006.01); H01Q 23/00 (2006.01); H01Q 9/04 (2006.01); G01J 5/10 (2006.01); H01Q 1/22 (2006.01); G01N 21/3581 (2014.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01J 1/42 (2013.01); G01J 5/10 (2013.01); G01N 21/3581 (2013.01); H01Q 1/2283 (2013.01); H01Q 1/36 (2013.01); H01Q 7/00 (2013.01); H01Q 9/0464 (2013.01); H01Q 23/00 (2013.01); G01J 2005/0077 (2013.01);
Abstract

An element configured to oscillate or detect an electromagnetic wave, the element comprising: a first dielectric portion having cylindrical shape and including a loop antenna on a first end surface thereof; a second dielectric portion connected to a second end surface of the first dielectric portion which is different from the first end surface; and an electrode portion which is disposed between the second dielectric portion and a substrate and is configured to reflect the electromagnetic wave.

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Tateishi, Yoshinori. (2022). Element for oscillating or detecting an electromagnetic wave and element manufacturing method (U.S. Patent No. 11391625). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11391625

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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