The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Nov. 14, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Masahiko Ohta, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01); G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01H 9/00 (2013.01); G01M 5/0008 (2013.01);
Abstract

A vibration measurement apparatusis an apparatus for measuring vibrations of an object. The vibration measurement apparatusincludes: a surface-direction displacement calculation unitconfigured to calculate, based on time-series images of a measurement target area that are output from an imaging apparatus, a displacement in a surface direction of the measurement target area; a normal-direction displacement calculation unitconfigured to calculate a displacement in a normal direction of the measurement target area, based on the time-series images and the displacement in the surface direction of the measurement target area; and a vibration calculation unitconfigured to calculate vibrations of the object, based on the calculated displacement in the surface direction of the measurement target area and the calculated displacement in the normal direction of the measurement target area.


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