The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jan. 15, 2021
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Qiaoen Luo, West Lafayette, IN (US);

Justin A. Patel, West Lafayette, IN (US);

Kevin J. Webb, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01);
Abstract

An ultra-sensitive speckle-analyzing system is disclosed which includes an image capture device configured to receive a scattered field having a speckle configuration and thereby capture i) a reference speckle image, and ii) a subsequent speckle image, each of the reference and the subsequent speckle images having a plurality of speckles on a background; and a processor configured to generate a cross-correlation between the plurality of speckles of the reference and the subsequent speckle images, to thereby represent a change in the speckle configuration.


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