The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Feb. 12, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Uwe Wiedmann, Clifton Park, NY (US);

Biju Jacob, Niskayuna, NY (US);

Peter Michael Edic, Albany, NY (US);

Brian David Yanoff, Schenectady, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/041 (2018.01); G01T 1/20 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4233 (2013.01); A61B 6/484 (2013.01); G01N 23/041 (2018.02); G01T 1/20184 (2020.05); G01T 1/241 (2013.01); G01T 1/247 (2013.01); G01N 2223/064 (2013.01); G01N 2223/304 (2013.01); G01N 2223/401 (2013.01);
Abstract

The present disclosure relates to fabrication and use of a phase-contrast imaging detector that includes sub-pixel resolution electrodes or photodiodes spaced to correspond to a phase-contrast interference pattern. A system using such a detector may employ fewer gratings than are typically used in a phase-contrast imaging system, with certain functionality typically provided by a detector-side analyzer grating being performed by sub-pixel resolution structures (e.g., electrodes or photodiodes) of the detector. Measurements acquired using the detector may be used to determine offset, amplitude, and phase of a phase-contrast interference pattern without multiple acquisitions at different phase steps.


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