The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Dec. 15, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Ryosuke Miki, Tokyo, JP;

So Sasatani, Tokyo, JP;

Hideyuki Kume, Tokyo, JP;

Masaya Itoh, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); G06T 15/20 (2011.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 15/20 (2013.01);
Abstract

An information processing apparatus simulates a measurable region of a sensor when the sensor is arranged in a measurement region to be measured, and the information processing apparatus includes: a generation unit that generates a measurement region map with environment information based on a three-dimensional model of the measurement region to be measured and the environment information that causes a change in a measurement result of the sensor; an execution unit that virtually arranges the sensor on the measurement region map with environment information generated by the generation unit, and simulates the measurable region of the sensor based on sensor information related to the measurable region of the sensor; and an output unit that outputs a result of simulation by the execution unit.


Find Patent Forward Citations

Loading…