The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Aug. 20, 2021
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Olli Piirainen, Oulu, FI;

Jaakko Vihriälä, Oulu, FI;

Ori Shental, Holmdel, NJ (US);

Sivarama Venkatesan, Holmdel, NJ (US);

Juha Myllylä, Oulu, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/12 (2006.01); H04B 7/0426 (2017.01); H04B 17/345 (2015.01); H04B 7/0456 (2017.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
H04B 7/043 (2013.01); H04B 7/0456 (2013.01); H04B 17/345 (2015.01); G06F 17/16 (2013.01);
Abstract

A technique is provided including at least obtaining a noise and interference covariance matrix, performing scaling of the noise and interference covariance matrix, determining a sum of diagonal elements of the scaled noise and interference covariance matrix, performing a first spectral shift by the sum to the scaled noise and interference covariance matrix to obtain a first spectral shifted matrix, performing eigenvalue decomposition to the first spectral shifted matrix to obtain an eigenvalue matrix, performing a second spectral shift by the sum to the eigenvalue matrix, limiting the eigenvalue matrix to a diagonal matrix, and obtaining a new noise and interference covariance matrix adding the scaled noise and interference covariance matrix and eigenvalue pairs that are obtained based, at least partly, on the performed eigenvalue decomposition.


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