The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Jul. 28, 2017
Applicant:

Sumitomo Metal Mining Co., Ltd., Tokyo, JP;

Inventors:

Haruki Kaneda, Niihama, JP;

Yuki Koshika, Niihama, JP;

Takaaki Ando, Niihama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/505 (2010.01); H01M 4/525 (2010.01); C01G 53/04 (2006.01); C01G 53/00 (2006.01); H01M 10/0525 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/525 (2013.01); C01G 53/006 (2013.01); C01G 53/04 (2013.01); C01G 53/50 (2013.01); H01M 4/505 (2013.01); H01M 10/0525 (2013.01); C01P 2002/72 (2013.01); C01P 2002/74 (2013.01); C01P 2004/50 (2013.01); C01P 2004/51 (2013.01); C01P 2004/61 (2013.01); C01P 2006/11 (2013.01); C01P 2006/12 (2013.01); C01P 2006/14 (2013.01); C01P 2006/40 (2013.01); H01M 2004/028 (2013.01);
Abstract

Provided are a positive electrode active material that can provide a secondary battery extremely excellent in output characteristics and having sufficient volume energy density, a nickel-manganese composite hydroxide as a precursor thereof, and methods for producing these. A nickel-manganese composite hydroxide is represented by General Formula (1): NiMnM(OH), and contains a secondary particle formed of a plurality of flocculated primary particles. The nickel-manganese composite hydroxide has a half width of a (001) plane of at least 0.40° and has an average degree of sparsity/density represented by [(a void area within the secondary particle/a cross section of the secondary particle)×100] (%) falling within a range of greater than 22% and up to 40%.


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