The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Mar. 02, 2020
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Shunpei Yamazaki, Setagaya, JP;

Yuhei Sato, Atsugi, JP;

Keiji Sato, Isehara, JP;

Tetsunori Maruyama, Atsugi, JP;

Junichi Koezuka, Tochigi, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/324 (2006.01); H01L 21/336 (2006.01); H01L 29/786 (2006.01); H01L 21/40 (2006.01); H01L 27/12 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 21/383 (2006.01); H01L 21/477 (2006.01);
U.S. Cl.
CPC ...
H01L 21/40 (2013.01); H01L 21/02175 (2013.01); H01L 21/02252 (2013.01); H01L 21/02565 (2013.01); H01L 21/02636 (2013.01); H01L 21/02664 (2013.01); H01L 21/324 (2013.01); H01L 21/383 (2013.01); H01L 21/477 (2013.01); H01L 27/1225 (2013.01); H01L 29/66742 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01);
Abstract

In a manufacturing process of a transistor including an oxide semiconductor film, oxygen doping treatment is performed on the oxide semiconductor film, and then heat treatment is performed on the oxide semiconductor film and an aluminum oxide film provided over the oxide semiconductor film. Consequently, an oxide semiconductor film which includes a region containing more oxygen than a stoichiometric composition is formed. The transistor formed using the oxide semiconductor film can have high reliability because the amount of change in the threshold voltage of the transistor by a bias-temperature stress test (BT test) is reduced.


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