The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Jun. 24, 2020
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Deeder M. Aurongzeb, Austin, TX (US);

Philip Conde, Austin, TX (US);

Nick Luna, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3233 (2016.01);
U.S. Cl.
CPC ...
G09G 3/3233 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0242 (2013.01); G09G 2320/041 (2013.01); G09G 2320/0693 (2013.01); G09G 2360/145 (2013.01);
Abstract

An information handling system may include a display comprising an organic light-emitting diode (OLED) panel and an OLED degradation management subsystem configured to, responsive to a condition for initiating a calibration of the OLED panel, logically divide the OLED panel into a plurality of non-overlapping test windows of a defined size, measure a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows to determine a deviation of the at least one test window from a linear degradation profile, and correct for non-linear degradation occurring in the at least one test window based on the deviation.


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