The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Mar. 11, 2020
Applicant:

Kazuma Goto, Ishikawa, JP;

Inventor:

Kazuma Goto, Ishikawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/40 (2022.01); A61B 5/24 (2021.01); A61B 5/00 (2006.01); G06F 16/2458 (2019.01); G06K 9/00 (2022.01); A61B 5/242 (2021.01);
U.S. Cl.
CPC ...
G06V 40/45 (2022.01); A61B 5/24 (2021.01); A61B 5/242 (2021.01); A61B 5/2415 (2021.01); A61B 5/4519 (2013.01); A61B 5/7235 (2013.01); G06F 16/2477 (2019.01); G06K 9/0053 (2013.01);
Abstract

A biometric apparatus includes a calculation device that processes first time series data from a first measuring device and second time series data from a second measuring device; a display device that displays the time series data; a trigger signal generator that generates one or more trigger signals; and an input unit, wherein the calculation device determines one or more specific intervals of the first time series data based on the one or more trigger signals; configures a classification reference for classifying time series data in the one or more specific intervals using the time series data in a first specific interval using an input signal as a trigger; classifies the second time series data for the one or more specific intervals using a result of classifying the first time series data based on the classification reference; and displays a classification result of the second time series data.


Find Patent Forward Citations

Loading…