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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11386570 B1

PDFFull Text
Date of Patent:
Jul. 12, 2022

Filed:

Feb. 20, 2020

Measurement method and measurement apparatus

Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Kiminori Toya, Kawasaki, JP;

Hiroshi Ohno, Chuo, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Manav Seth

Int. Cl.
CPC ...
G06T 7/70 (2017.01); G01N 21/45 (2006.01); G01N 21/95 (2006.01); G02B 27/54 (2006.01); G06T 7/00 (2017.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G01N 21/45 (2013.01); G01N 21/95 (2013.01); G02B 27/14 (2013.01); G02B 27/54 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10 (2013.01);
Abstract

According to one embodiment, a measurement method includes: acquiring a first picture including a background image and a substance, the substance allowing transmission of light from the background image; acquiring a second picture including the background image and the substance in a different positional relation with respect to the first picture; and calculating a first displacement amount representing a difference in position of the background image between the first picture and the second picture.

Find Patent Forward Citations

Toya, Kiminori. (2022). Measurement method and measurement apparatus (U.S. Patent No. 11386570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11386570

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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