The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
May. 28, 2020
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Naoki Morimoto, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 11/00 (2006.01); G01F 22/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G01F 22/00 (2013.01); G06T 11/008 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10116 (2013.01);
Abstract
An X-ray imaging apparatus is configured to acquire a plurality of pieces of slice image data from volume data, acquire a plurality of pieces of first processed image data by performing first processing, acquire a plurality of pieces of second processed image data by performing second processing, detect edges of the subject based on the acquired plurality of pieces of the second processed image data, and acquire edge image data including detected edges of the subject.