The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Aug. 22, 2019
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Ali Al Shehri, Thuwal, SA;

Ahmad Aldabbagh, Thuwal, SA;

Ayman Amer, Thuwal, SA;

Vincent Cunningham, Thuwal, SA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/20 (2019.01); G01J 5/00 (2022.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G01J 5/48 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01J 5/00 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06N 20/20 (2019.01); G01J 5/48 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A technological solution for analyzing a sequence of electromagnetic spectrum image frames of a nonmetallic asset and detecting or predicting an aberration in the asset, including a detected or predicted location of the aberration. The technological solution includes receiving the electromagnetic spectrum image frames by a pair of machine learning systems of different types, applying a machine learning algorithm to the electromagnetic spectrum image frames to stratify the electromagnetic spectrum images into abstraction levels according to an image topology and output first aberration determination information, applying a second machine learning algorithm to the electromagnetic spectrum image frames to detect patterns in electromagnetic spectrum images over time and output second aberration determination information, generating an aberration assessment based on the first and second aberration determination information, and transmitting the aberration assessment to a communicating device, including a prediction and location of an aberration in or on the nonmetallic asset.


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