The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Jan. 21, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Shinichiro Yoshida, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 20/20 (2019.01); G06T 7/97 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20224 (2013.01);
Abstract

Provided are an image processing apparatus, an image processing method, and a storage medium that can determine an anomaly while reducing influence of an individual difference of images. The image processing apparatus includes: a first generation unit that generates a first estimation image including at least a predetermined region of an inspection target by using a part of an inspection image including the inspection target; a second generation unit that estimates a difference between the first estimation image and the inspection image to generate a second estimation image by using the part of the inspection image; a comparison unit that compares the first estimation image with the inspection image; and an output unit that outputs a comparison result obtained by the comparison unit, and the comparison unit compares a difference between the first estimation image and the inspection image with the second estimation image.


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