The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Oct. 24, 2019
Nec Corporation, Tokyo, JP;
Takeshi Arikuma, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
The present invention provides an image analysis device which is capable of automatically responding to various environmental variations caused by a camera installation condition or an environmental factor without consuming unnecessary calculation resources. The image analysis device is provided with: a plurality of process execution units which are capable of executing different processes on an input image; an analysis unit which analyzes, on the basis of the image, an image variation caused by external environment; and a process selection unit which selects, on the basis of the analyzed variation, at least one from among the plurality of process execution units.