The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Nov. 06, 2020
Applicant:

Datarobot, Inc., Boston, MA (US);

Inventors:

Amanda Claire Schierz, Hampshire, GB;

Jeremy Achin, Boston, MA (US);

Zachary Albert Mayer, Boston, MA (US);

Assignee:

DataRobot, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/23 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/2379 (2019.01); G06N 20/00 (2019.01);
Abstract

Methods for detection of anomalous data samples from a plurality of data samples are provided. In some embodiments, an anomaly detection procedure that includes a plurality of tasks is executed to identify the anomalous data samples from the plurality of data samples.


Find Patent Forward Citations

Schierz, Amanda. (2022). Methods for detecting and interpreting data anomalies, and related systems and devices (U.S. Patent No. 11386075). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11386075

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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