The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Oct. 27, 2016
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Gavril Giurgiu, Deerfield, IL (US);

Alex Averbuch, Buffalo Grove, IL (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/29 (2019.01); G01C 21/32 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G01C 21/32 (2013.01); G06F 16/23 (2019.01); G06F 16/29 (2019.01);
Abstract

A method is provided for verifying and/or updating map geometry based on a probe data. A method may include: receiving probe data from a plurality of probes within a region, where the probe data includes at least one of heading information and location information for each probe data point; matching the probe data to a link segment to generate map-matched probe data; calculating a difference between the at least one of heading information and location information of the map-matched probe data points and of the link segment; determining a statistical mean of the data; determining an error of the statistical mean of the data; and flagging the link segment for manual review in response to the statistical mean being greater than the error of the statistical mean multiplied by a biasing factor.


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