The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Feb. 17, 2021
Seiko Epson Corporation, Tokyo, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A position detection method of detecting a position in an operation surface pointed by a pointing element, the method including irradiating with infrared light toward the operation surface, obtaining a first and second taken image calibrated with respect to the operation surface by imaging the operation surface with a first and second camera configured to take an image with the infrared light, forming a difference image between the first taken image and the second taken image, extracting an area in which an amount of disparity between the first taken image and the second taken image is within a predetermined range out of the difference image as a candidate area in which an image of the pointing element is included, detecting an area corresponding to a tip position of the pointing element from the candidate area extracted based on a shape of the pointing element, and outputting, based on the area corresponding to a tip position, information representing a pointing position of the pointing element in the operation surface and whether or not the pointing element had contact with the operation surface.