The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Feb. 07, 2019
Applicants:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Wan-Eih Huang, West Lafayette, IN (US);

Jan Allebach, Boise, ID (US);

Richard Eric Maggard, Boise, ID (US);

Renee Jeanette Jessome, Boise, ID (US);

Mark Quentin Shaw, Boise, ID (US);

Assignees:

Hewlett-Packard Development Company, L.P., Spring, TX (US);

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5058 (2013.01); G03G 15/5037 (2013.01); G03G 15/5062 (2013.01); G03G 15/55 (2013.01);
Abstract

Examples of methods are described herein. In some examples, a method includes calculating a first cost function measure based on band defects in an image. In some examples, the method also includes calculating a second cost function measure based on the band defects and a synthetic band. In some examples, the method further includes detecting a missing band based on a comparison of the first cost function measure and the second cost function measure.


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