The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Apr. 30, 2020
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Hyounghan Kwon, Pasadena, CA (US);

Ehsan Arbabi, Arcadia, CA (US);

Andrei Faraon, La Canada Flintridge, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01J 9/02 (2006.01); G02B 1/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0092 (2013.01); G01J 9/02 (2013.01); G02B 1/002 (2013.01); G02B 21/0056 (2013.01); G01J 2009/0261 (2013.01); G01J 2009/0269 (2013.01);
Abstract

Quantitative phase gradient microscopes (QPGM) using metasurface layers including birefringent lenses are disclosed. The birefringent lenses are manufactured by patterning nanoposts on two different transparent substrates or on opposite sides of the same transparent substrate. Methods to generate phase gradient images (PGI) of objects using the described devices are also disclosed.


Find Patent Forward Citations

Kwon, Hyounghan. (2022). Metasurface imager for quantitative phase gradient detection (U.S. Patent No. 11385450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11385450

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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