The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Jul. 06, 2017
China Communication Technology Co., Ltd, Shenzhen, CN;
Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd, Shenzhen, CN;
Chunchao Qi, Shenzhen, CN;
Chao Sun, Shenzhen, CN;
Shukai Zhao, Shenzhen, CN;
Guangsheng Wu, Shenzhen, CN;
Qing Ding, Shenzhen, CN;
CHINA COMMUNICATION TECHNOLOGY CO., LTD., Shenzhen, CN;
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD., Shenzhen, CN;
Abstract
A millimeter wave security inspection instrument debugging system and a millimeter wave security inspection instrument debugging method, which are used for debugging the imaging definition of a millimeter wave holographic imaging security inspection system. A main control apparatus is used for generating a millimeter wave detection signal and a reference signal. The main control apparatus is also used for, where a millimeter wave transmitting antenna, a millimeter wave receiving antenna and a detected object are respectively located at different relative positions, transmitting the millimeter wave detection signal to the detected object by means of the millimeter wave transmitting antenna, and receiving an echo signal reflected from the detected object by means of the millimeter wave receiving antenna, and then using a holographic image technique to perform three-dimensional imaging according to the reference signal and the echo signal. The main control apparatus can finally obtain a plurality of three-dimensional imaging results, so that the optimal relative positions of the millimeter wave transmitting antenna, the millimeter wave receiving antenna and the detected object can be determined, which results are applied to a millimeter wave holographic imaging security inspection system, thereby improving the imaging definition of the millimeter wave holographic imaging security inspection system.