The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Dec. 21, 2017
Topcon Corporation, Tokyo, JP;
You Sasaki, Tokyo, JP;
Tadayuki Ito, Tokyo, JP;
Topcon Corporation, Tokyo, JP;
Abstract
A method for calibrating unevenness of a plurality of measuring elements in an apparatus for evaluating road surface property having a plurality of measuring elements repeats steps of computing separation quantities from a calibration reference plane on a reference area regarding all measuring elements; determining a measuring element where the separation quantity is maximum from among all the measuring element to calibrate the measuring element such that a difference between point cloud data produced from a measurement value of the measuring element where the separation quantity is maximum and the calibration reference plane becomes equal or less than a predetermined value, producing a new calibration reference plane from the measurement values of the measuring elements including the calibrated measuring element, until RMS of point cloud data does not change.