The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Sep. 27, 2019
Applicant:

Sri International, Menlo Park, CA (US);

Inventors:

John J Buonocore, Menlo Park, CA (US);

David Watt, Menlo Park, CA (US);

Roman Y Novoselov, Menlo Park, CA (US);

Steven Chen, Menlo Park, CA (US);

Leon Tao, Menlo Park, CA (US);

Mark Schutzer, Menlo Park, CA (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/35 (2006.01); G01S 13/02 (2006.01); G01S 13/95 (2006.01);
U.S. Cl.
CPC ...
G01S 7/352 (2013.01); G01S 13/0209 (2013.01); G01S 7/358 (2021.05); G01S 13/955 (2013.01);
Abstract

Implementation of radio frequency applications in satellite environments can be constrained by size, mass, cost, and power limitations. These applications can include radar, communications, radio astronomy, or other scientific or industrial applications. A variety of systems are provided to facilitate recording of baseband radio frequency signals at high bandwidth and low power using low-cost components. These systems include field-programmable gate arrays or other programmable logic devices integrating between high-frequency ADCs and two or more multiplexed non-volatile storage mediums. Also provided are systems for providing calibration and self-test functionality in a low-cost, flexible, low-power radio frequency frontend. These systems include high-frequency switches configured to allow a calibration and/or self-test pulse to be acquired for each radar pulse generated by the system.


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