The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Sep. 24, 2020
Applicant:
Stmicroelectronics SA, Montrouge, FR;
Inventors:
Ricardo Gomez Gomez, Grenoble, FR;
Sylvain Clerc, Grenbole, FR;
Assignee:
STMICROELECTRONICS SA, Montrouge, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G06F 11/16 (2006.01); G06F 11/267 (2006.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01); G06F 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31926 (2013.01); G01R 31/31716 (2013.01); G01R 31/31935 (2013.01); G01R 31/318566 (2013.01); G06F 11/1629 (2013.01); G06F 11/1645 (2013.01); G06F 11/183 (2013.01); G06F 11/267 (2013.01);
Abstract
A method tests at least three devices, each device including a test chain having a plurality of positions storing test data. The testing includes comparing test data in a last position of the test chain of each of the devices, and shifting test data in the test chains of each of the devices and storing a result of the comparison in a first position of the test chains of each of the devices. The comparing and the shifting and storing are repeated until all the stored test data has been compared. The at least three devices may have a same functionality and a same structure.