The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Feb. 17, 2017
Applicant:

The Boeing Company, Chicago, IL (US);

Inventor:

Curtis R. Estevo, Mesa, AZ (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/28 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/28 (2013.01); G01N 29/225 (2013.01); G01N 29/265 (2013.01); G01N 2291/106 (2013.01);
Abstract

An inspection system comprises a sensor array and a fluid chamber. The fluid chamber is configured to provide a fluid coupling environment between the sensor array and a structure. The fluid chamber comprises a bellows having a first side and a second side opposite the first side, wherein the first side is a flexible lip.


Find Patent Forward Citations

Estevo, Curtis. (2022). Inspection system (U.S. Patent No. 11385205). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11385205

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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