The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
May. 10, 2018
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Hiroyuki Chiba, Tokyo, JP;
Miku Maehara, Tokyo, JP;
Yoshinobu Hoshino, Tokyo, JP;
Shigeru Kawamata, Tokyo, JP;
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2251 (2018.01); H04N 5/232 (2006.01); G01N 23/2204 (2018.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); G01N 23/2204 (2013.01); H04N 5/232933 (2018.08); H04N 5/232945 (2018.08); H04N 5/2628 (2013.01); G01N 2223/07 (2013.01); G01N 2223/418 (2013.01); G01N 2223/507 (2013.01);
Abstract
An object of the invention is to easily acquire images of a position corresponding among a plurality of sample sections in an imaging device that acquires images of the plurality of sample sections. The imaging device according to the invention generates a cursor for specifying a first observation region and a contour portion of a first sample section, and superimposes the cursor on a contour portion of a second sample section so as to calculate coordinates of a second observation region of the second sample section.