The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

May. 09, 2019
Applicant:

National Research Council of Canada, Ottawa, CA;

Inventors:

Paul Bouchard, Boucherville, CA;

Mohamad Sabsabi, Boucherville, CA;

Alain Blouin, Boucherville, CA;

Christian Padioleau, Boucherville, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/443 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01N 21/718 (2013.01); G01J 3/0272 (2013.01); G01J 3/0291 (2013.01); G01J 3/1804 (2013.01); G01J 3/2803 (2013.01); G01J 3/36 (2013.01); G01J 3/443 (2013.01); G01N 2201/0221 (2013.01);
Abstract

A LIBS system to detect constituent elements of interest within a sample from plasma light resulting from irradiation of this sample is presented. The LIBS system has a hybrid configuration which provides both a low-resolution spectrum of the plasma light covering a broad spectral range, and a high-resolution spectrum of the same plasma light over a narrow spectral range centered on a spectral line or feature of a constituent element of interest of the sample. In some implementations, the LIBS system has a portable design and can perform onsite sample analyses.


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