The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Apr. 12, 2019
Applicant:

Washington University, St. Louis, MO (US);

Inventors:

Pratim Biswas, St. Louis, MO (US);

Jiayu Li, St. Louis, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/53 (2006.01); G01N 1/22 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 21/532 (2013.01); G01N 1/2202 (2013.01); G01N 21/274 (2013.01); G01N 2001/2223 (2013.01);
Abstract

A sensor analysis computer device for analyzing particulate matter is provided. The computer device includes at least one memory and at least one processor in communication with the at least one memory. The computer device is in communication with a sensor configured to measure particulate matter. The at least one processor is programmed to store a plurality of parameter data for the sensor including a calibration factor, receive a plurality of sensor data from the sensor, determine a present calibration factor based on the plurality of parameter data and the plurality of sensor data, determine an updated calibration factor for the sensor based on the present calibration factor and the plurality of parameter data, and transmit the updated calibration factor to the sensor, wherein the sensor is configured to adjust subsequent sensor data based on the updated calibration factor.


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