The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Apr. 09, 2020
Hitachi, Ltd., Tokyo, JP;
Tomonari Misawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A particle size measuring apparatus capable of measuring a smaller particle size includes: a first light source configured to emit parallel beam to a sample containing particles; a first image capturing apparatus disposed to approximately face the first light source with the sample disposed therebetween and configured to capture an image of the sample; and an image analyzing unit configured to analyze the image captured by the first image capturing apparatus. The first image capturing apparatus and the first light source are disposed so as to approximately face each other so that an image of scattered light of the parallel beam incident on particles and scattered at a prescribed angle θth or smaller is captured by the first image capturing apparatus. The image analyzing unit is configured to calculate a particle size on the basis of a scattered light image captured by the first image capturing apparatus.