The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2022
Filed:
Jul. 24, 2018
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Young-Ho Cho, Daejeon, KR;
Sunghyun Yoon, Daejeon, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Abstract
An elasticity measurement apparatus includes a lower layer structure having first and second openings, first and second deformable membranes covering the first and second openings to define first and second chamber and deformable by pressure within the first and second chambers respectively, a support layer structure on the lower layer structure to protrude and configured to support the first and second deformable membranes to be spaced apart from the elastic body, a driving portion to apply pressure within the first and second chambers to deform the first and second deformable membranes, and first and second deformation detecting portions to detect deformations of first and second deformable membranes. When the pressure within the first and second chambers is increased from a first pressure to a second pressure, the first deformable membrane is deformed with contacting the elastic body, while the second deformable membrane is deformed without contacting the elastic body.