The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

Sep. 18, 2018
Applicant:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Inventors:

Weston F. Harding, Lehi, UT (US);

Austin Jason Mckinnon, Herriman, UT (US);

Matthew Oshinski, Oak Ridge, NJ (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/40 (2006.01); G01N 1/02 (2006.01); G01N 33/15 (2006.01); B01L 3/00 (2006.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
G01N 1/405 (2013.01); B01L 3/5029 (2013.01); G01N 1/02 (2013.01); G01N 33/15 (2013.01); B01L 3/5082 (2013.01); B01L 3/50825 (2013.01); B01L 2200/082 (2013.01); B01L 2200/16 (2013.01); B01L 2200/185 (2013.01); B01L 2300/0825 (2013.01); G01N 1/38 (2013.01); G01N 2001/028 (2013.01);
Abstract

Sampling systems and techniques that increase pickup efficiency and shedding efficiency of an analyst of interest collected from a surface are provided. In one aspect, an absorbent swab collects an analyte of interest, such as a hazardous contaminant, from a test area demarcated by a template. The sampling techniques can include swab speed and force protocols specifying how fast and how hard the user should apply the swab across the surface to improve pickup efficiency. The sampling techniques can include instructions for inverting a container enclosing the swab and collected contaminant to improve shedding efficiency from the swab.


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